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Integrated built-in-test false and missed alarms reduction based on forward infinite impulse response & recurrent finite impulse response dynamic neural networks

机译:基于前向无限冲激响应和递归有限冲激响应动态神经网络的集成式内置测试错误和漏失警报减少

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摘要

Built-in tests (BITs) are widely used in mechanical systems to perform state identification, whereas the BIT false and missed alarms cause trouble to the operators or beneficiaries to make correct judgments. Artificial neural networks (ANN) are previously used for false and missed alarms identification, which has the features such as self-organizing and self-study. However, these ANN models generally do not incorporate the temporal effect of the bottom-level threshold comparison outputs and the historical temporal features are not fully considered. To improve the situation, this paper proposes a new integrated BIT design methodology by incorporating a novel type of dynamic neural networks (DNN) model. The new DNN model is termed as Forward 1IR & Recurrent FIR DNN (FIRF-DNN), where its component neurons, network structures, and input/output relationships are discussed. The condition monitoring false and missed alarms reduction implementation scheme based on FIRF-DNN model is also illustrated, which is composed of three stages including model training, false and missed alarms detection, and false and missed alarms suppression. Finally, the proposed methodology is demonstrated in the application study and the experimental results are analyzed.
机译:内置测试(BITs)被广泛用于机械系统中以进行状态识别,而BIT错误和遗漏警报会给操作员或受益者做出正确的判断带来麻烦。人工神经网络(ANN)以前被用于错误和遗漏警报的识别,具有诸如自组织和自学习的功能。但是,这些ANN模型通常不包含最低级别阈值比较输出的时间效应,并且历史时间特征没有得到充分考虑。为了改善这种情况,本文提出了一种新的集成BIT设计方法,该方法结合了一种新型的动态神经网络(DNN)模型。新的DNN模型称为正向1IR和递归FIR DNN(FIRF-DNN),其中讨论了其组成神经元,网络结构和输入/输出关系。阐述了一种基于FIRF-DNN模型的状态监测漏报减少算法的实现方案,该方案包括模型训练,漏报检测和漏报抑制三个阶段。最后,在应用研究中证明了所提出的方法并分析了实验结果。

著录项

  • 来源
    《Mechanical systems and signal processing》 |2017年第11期|273-290|共18页
  • 作者单位

    School of Reliability and Systems Engineering, Beihang University, Beijing, China ,Science and Technology Key Laboratory on Reliability and Environmental Engineering, Beihang University, Beijing, China;

    School of Reliability and Systems Engineering, Beihang University, Beijing, China ,Science and Technology Key Laboratory on Reliability and Environmental Engineering, Beihang University, Beijing, China;

    School of Reliability and Systems Engineering, Beihang University, Beijing, China ,Science and Technology Key Laboratory on Reliability and Environmental Engineering, Beihang University, Beijing, China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Built-in test (BIT); State identification; False and missed alarms; Dynamic Neural Networks (DNN); Infinite and finite impulse response;

    机译:内置测试(BIT);状态识别;错误和错过的警报;动态神经网络(DNN);无限和有限脉冲响应;

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