High Sensitivity, One-Sided X-Ray Inspection System

摘要

A backscatter x-ray imaging method for nondestructive testing has been developed. The one-sided inspection technique, a slot camera, is much faster in response than previous backscatter methods. Delaminations in graphite-epoxy composites and other low atomic number materials have been detected. Wall thicknesses up to 7 cm thick have been interrogated. The results show the location (depth) and magnitude (separation width) of simulated delaminations throughout the entire wall. A disbond between two flat surfaces in contact has been detected. Feasibility of the system has been shown with film detectors. A fastresponse electronic detector is proposed. The objective of this program was to demonstrate the feasibility of an x-ray inspection equipment capable of probing an inspection sample from only one side to detect delaminations, voids, cracks or foreign material through the thickness interrogated. The feasibility of a unique, patented x-ray slot camera that works by scattered radiation was demonstrated using film techniques. The unique capability of this slot camera is that it can obtain images of the internal structure of an object at depths of many centimeters (depending on the object density and the x-ray energy) with a sensitivity that is several orders of magnitude greater than past-developed scattered radiation cameras.