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X-ray inspection apparatus, x-ray inspection method, x-ray inspection program, and x-ray inspection system

机译:X射线检查装置,X射线检查方法,X射线检查程序以及X射线检查系统

摘要

An X-ray inspection apparatus (100) previously acquires and stores a mask thickness in a cream solder printing as a thickness of the solder applied on the board. In a cross-section parallel to a board surface, a range in a height direction is set as an inspection target from the mask thickness of the inspection target board, and the number of cross-sections (N) is specified (S801). The X-ray inspection apparatus (100) measures an area (S) and roundness (T) of the solder in an inspection window for each cross-section (S807 to S819). When the minimum values of the area (S) and roundness (T) are not lower than reference values, the X-ray inspection apparatus (100) determines that the soldering of the inspection window is nondefective (S821 and S823). When one of the minimum values of the area (S) and roundness (T) is lower than the reference value, the X-ray inspection apparatus (100) determines that the soldering of the inspection window is defective (S821 and S823).
机译:X射线检查装置(100)预先在膏状焊料印刷中获取并存储掩模厚度作为施加在板上的焊料的厚度。在平行于板表面的横截面中,从检查目标板的掩模厚度将高度方向上的范围设置为检查目标,并且指定横截面数(N)(S801)。 X射线检查装置(100)针对每个截面在检查窗内测量焊料的面积(S)和圆度(T)(S807至S819)。当面积(S)和圆度(T)的最小值不低于基准值时,X射线检查装置(100)判断为检查窗的焊接是合格的(S821和S823)。当面积(S)和圆度(T)的最小值之一低于参考值时,X射线检查设备(100)确定检查窗的焊接不良(S821和S823)。

著录项

  • 公开/公告号EP2365320A2

    专利类型

  • 公开/公告日2011-09-14

    原文格式PDF

  • 申请/专利权人 OMRON CORPORATION;

    申请/专利号EP20110153152

  • 发明设计人 MURAKAMI KIYOSHI;KASAHARA HIRONORI;

    申请日2011-02-03

  • 分类号G01N23/18;H01L21/66;

  • 国家 EP

  • 入库时间 2022-08-21 17:53:41

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