Electromagnetics and Electrothermal Approach to Evaluate Failures in Microelectronic Devices Caused by Electrostatic Discharges: Stochastical Aspects of the Device Reliability

摘要

This report summarizes the following research efforts addressed in the project: Interaction of electromagnetic overstresses, such as electrostatic discharge (ESD) with the microelectronic devices, resulting IC damage(s) and methods of preventing the related failures.