Theory and Practice of Radiation Dosimetry in the Radiation Hardness Testing of Electronic Devices and Systems

摘要

This monograph covers, in condensed form, the essentials of radiation dosimetry as it is applicable to radiation hardness testing of electronics. An overview of general dosimetry concepts treats absorbed dose and dose rate, charged particle equilibrium, and interface dose enhancement. The most practical techniques for measurement of absorbed dose and dose rate are discussed, both for flash x-ray and cobalt-60 testing. Methods for determining flash x-ray and cobalt-60 spectra are covered briefly. Applications to electronic device testing are discussed with special emphasis on applicable standards. An extensive bibliography is included as an aid for further research. Keywords: Thermoluminescent dosimeters; Calorimeters; Semiconductor detectors; Scintillator-photodiode detectors.