Fault Model Development for Fault Tolerant VLSI Design

摘要

Fault models provide systematic and precise representations of physical defects in microcircuits in a form suitable for simulation and test generation. The current difficulty in testing VLSI circuits can be attributed to the tremendous increase in design complexity and the inappropriateness of traditional stuck-at fault models. This report develops fault models for three different types of common defects that are not accurately represented by the stuck-at fault model. The faults examined in this report are: bridging faults, transistor stuck-open faults, and transient faults caused by alpha particle radiation. A generalized fault model could not be developed for the three fault types. However, microcircuit behavior and fault detection strategies are described for the bridging, transistor stuck-open, and transient (alpha particle strike) faults. The results of this study can be applied to the simulation and analysis of faults in fault tolerant VLSI circuits. (kr)