Testing and Data Path Redesign of a High Speed, 16-Point Winograd Fourier Transform Processor.

摘要

A prototype 16-point, 70 MHz Fourier transform processor using 1.2 micron minimum feature sizes was tested using a Tektronix DAS 9200, digital analysis system. The results showed that it is possible to operate an Air Force Institute of Technology (AFIT) WFT16 chip at 70 MHz. The results also showed a great deal of variation among the individual packaged chips. Using the WFT16's built in testing circuitry, portions of the main data and control circuitry were tested. The AFIT XROM address generator and control circuitry proved to be the most reliable chip subsection, followed by the arithmetic and register control system. The parallel-in serial-out input data register was also tested and showed consistent results even though the results were not as expected. The variation among chips was shown when attempts at trivial transforms were done. The attempted transforms consisted of DC data values of zero and minus one. Two of 16 tested chips showed correct transform values, but for only a limited, nonrepeated sequence. In later testing, two chips were found that gave repeatable results which closely approximated the expected results for both trivial and nontrivial transform attempts. Test procedures and input to output relationships were determined to aid further testing of the AFIT WFT16 circuit. Keywords: Military theses; Semiconductor chips. (kt)