Fluorescent Lifetime Measurements of Rare Earth Elements in Gallium Arsenide

摘要

Lifetime measurements of the excited states of three GaAs semiconductors dopedwith the rare earth elements Erbium (Er), Praseodymium (Pr), and Thulium (Tm) has been studied using a pulsed nitrogen laser and germanium detector. The measurements were made with an experimental set up with a system response time of 0.34 microseconds. A 330 milliwatt nitrogen laser with a wavelength of 3370 angstroms was used to excite transitions of the rare earth elements.