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Electronic transport at low temperature below the field-driven superconductor-insulator transition in thin a-MoxSi1-x films

机译:a-MoxSi1-x薄膜中低于场驱动超导体-绝缘体转变的低温电子传输

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We have shown so far that thin amorphous (a-)MoxSi1-x films exhibit the field-driven superconductor-insulator transition (SIT) at zero temperature (T = 0), while the existence of a metallic quantum-vortex-liquid at T = 0 has been reported in several thin amorphous films. Here we reexamine the possibility of the metallic phase by measuring the T dependence of resistance R(T) for the thin a-MoxSi1-x films with various transition temperatures TO in fields B below the critical field of the "SIT". We find that the value of T-c0 dominates R(7) at low T. For films with T-c0 larger than 1.0 K, the activation energy U derived from the slope of the Arrhenius plot of R is constant over the whole T region, while for films with Tco < 1.0 K, U exhibits a discontinuous decrease below about 0. 1 K; however, U remains constant and positive down to the lowest T. All of the data are consistent with the picture of the field-driven SIT. (c) 2005 Elsevier B.V. All rights reserved.
机译:到目前为止,我们已经证明,非晶(a-)MoxSi1-x薄膜在零温度(T = 0)时表现出场驱动的超导体-绝缘体转变(SIT),而在T处存在金属量子涡旋液体在几片非晶薄膜中已报道= 0。在这里,我们通过测量在“ SIT”临界场以下的场B中具有各种转变温度TO的a-MoxSi1-x薄膜的电阻R(T)的T依赖性来重新检查金属相的可能性。我们发现在低T下T-c0的值主导R(7)。对于T-c0大于1.0 K的薄膜,从R的阿伦尼乌斯图的斜率得出的活化能U在整个T区域内是恒定的,而对于Tco <1.0 K的薄膜,U在约0. 1 K以下呈现不连续的降低;但是,U保持恒定,直到最低T都为正。所有数据与现场驱动SIT的图像一致。 (c)2005 Elsevier B.V.保留所有权利。

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