...
首页> 外文期刊>Physica, B. Condensed Matter >Optical properties of Mn-doped InAs and InMnAs epitaxial films
【24h】

Optical properties of Mn-doped InAs and InMnAs epitaxial films

机译:掺Mn的InAs和InMnAs外延膜的光学性质

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

The optical properties of In1-xMnxAs ferromagnetic semiconductors have been measured over the spectral range of 0.05-3.5 eV to determine their electronic structure. For single-phase InMnAs alloy thin films (x<0.01-0.12), a band gap of 0.334 eV, 23 meV lower than InAs, is observed at 295 K. The decrease is attributed to the formation of a shallow manganese impurity band. Reflectance peaks arising from higher lying L-point transitions between the valence band and conduction band are observed in InMnAs thin films. The energy of these transitions decreases with increasing manganese concentration. This demonstrates that the manganese impurity band broadens at the L-point. A broad featureless absorption band was observed between 0.05 and 0.30 eV. This extrinsic absorption band is attributed to light hole to heavy hole inter-valence band transitions. The measured low-frequency optical conductivity is in good agreement with that determined from electrical resistivity measurements. (C) 2003 Elsevier B.V. All rights reserved. [References: 19]
机译:已在0.05-3.5 eV的光谱范围内测量了In1-xMnxAs铁磁半导体的光学性能,以确定其电子结构。对于单相InMnAs合金薄膜(x <0.01-0.12),在295 K处观察到能带隙为0.334 eV,比InAs低23 meV。该下降归因于形成了较浅的锰杂质带。在InMnAs薄膜中观察到价带和导带之间较高的L点跃迁引起的反射峰。这些转变的能量随着锰浓度的增加而降低。这表明锰杂质带在L点变宽。在0.05至0.30 eV之间观察到较宽的无特征吸收带。该外部吸收带归因于轻空穴到重空穴的价带跃迁。测得的低频光学电导率与从电阻率测量值确定的电导率非常一致。 (C)2003 Elsevier B.V.保留所有权利。 [参考:19]

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号