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Impurity levels in P-type layered semiconductor InSe doped with Hg

机译:掺杂有Hg的P型层状半导体InSe中的杂质水平

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Photoluminescence (PL) and Hall effect measurements have been made on Hg-doped p-type InSe. A broad emission band at 1.237 eV (77 K) is mainly observed on the PL spectra of samples doped with Hg and, in the range 0.02 to 0.1 at%, the PL intensity increases with increasing Hg concentration. From the temperature dependences of the PL intensity and peak energy position, we show that the 1.237 eV emission band is due to the transition between a shallow donor level and a deep acceptor level, at 0.07 eV above the valence band. The dominant acceptor level in the carrier transport measurements shows the same energy position as the radiative recombination center. [References: 15]
机译:已经在掺汞的p型InSe上进行了光致发光(PL)和霍尔效应测量。主要在掺杂Hg的样品的PL光谱中观察到1.237 eV(77 K)处的宽发射带,并且在0.02至0.1 at%的范围内,PL强度随Hg浓度的增加而增加。从PL强度和峰值能量位置的温度依赖性,我们表明1.237 eV发射带是由于在价带之上0.07 eV处的浅施主能级和深受体能级之间的过渡引起的。载流子传输测量中的主要受体能级显示出与辐射复合中心相同的能量位置。 [参考:15]

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