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Bound excitons in wide-gap II-VI and nitride semiconductors. Comparison of optical studies of shallow dopants in these materials

机译:宽间隙II-VI和氮化物半导体中的束缚激子。这些材料中浅掺杂剂的光学研究比较

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In this paper recent results of optical studies of bound excitons in wide-gap II-VI and nitride semiconductors are surveyed. In the first part latest results about self-compensation mechanisms will be presented. Then, the dynamical characteristics of excitonic transitions are evaluated for various impurities, dopants, and dopant concentrations, and for excitation via particular resonant excitation channels. Relaxation and conversion channels between excitonic systems are analyzed, especially in strained heteroepitaxial systems which show splitting effects of the bands from which the carriers stem. The dynamical behavior of excitons in wide-gap material gives evidence of nonradiative decay channels. Calorimetric spectroscopy at mK temperatures was used to investigate the nonradiative processes and to determine quantum efficiencies. Recent results of transient four-wave mixing experiments at bound-exciton complexes will be shown to demonstrate that shallow defects influence the dephasing in the investigated systems which gives information about the homogeneous and inhomogeneous broadening mechanisms. In the last part negatively charged excitons (trions) were observed in unintentionally donor doped Zn0.90Mg0.10Se/ZnSe single quantum wells by magneto-luminescence experiments. The binding energy of the trion singlet ground state is about 2.7 meV. [References: 15]
机译:在本文中,我们对宽间隙II-VI和氮化物半导体中束缚激子的光学研究进行了最新研究。在第一部分中,将介绍有关自补偿机制的最新结果。然后,针对各种杂质,掺杂剂和掺杂剂浓度以及通过特定的共振激发通道进行激发,评估了激子跃迁的动力学特性。分析了激子系统之间的弛豫和转换通道,特别是在应变异质外延系统中,该系统显示出载流子从中产生的谱带的分裂效应。激子在宽间隙材料中的动力学行为提供了非辐射衰变通道的证据。 mK温度下的量热光谱法用于研究非辐射过程并确定量子效率。结合激发态复合物的瞬态四波混合实验的最新结果将表明,浅层缺陷会影响所研究系统中的相移,从而提供有关均相和非均相展宽机制的信息。在最后一部分中,通过磁致发光实验,在无意掺杂的施主掺杂的Zn0.90Mg0.10Se / ZnSe单量子阱中观察到了带负电的激子(三价子)。三重态单线态基态的结合能约为2.7 meV。 [参考:15]

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