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首页> 外文期刊>Physica status solidi, B. Basic research >Thermodynamic Analysis on the MOVPE Growth of Nitride Semiconductors Using Hydrazine
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Thermodynamic Analysis on the MOVPE Growth of Nitride Semiconductors Using Hydrazine

机译:肼对氮化物半导体MOVPE生长的热力学分析

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摘要

A thermodynamic analysis is performed on the MOVPE growth of nitride semiconductors using hydrazine (N_2H_4) instead of NH_3. Equilibrium partial pressures are calculated for various deposition parameters and growth regions are examined. It is predicted that the growth of nitride occurs drastically in the N_2H_4 system, especially for the indium containing nitride without the deposition of In droplets. It is also shown that the composition unstable region for InGaN is suppressed in the N_2H_4 system and the effect of hydrogen on the composition of InGaN is small in the N_2H_4 system compared with the NH_3 system.
机译:使用肼(N_2H_4)代替NH_3对氮化物半导体的MOVPE生长进行热力学分析。计算各种沉积参数的平衡分压,并检查生长区域。可以预见,在N_2H_4系统中,氮化物的生长会急剧增加,特别是对于没有铟液滴沉积的含铟氮化物。还显示出在N_2H_4系统中抑制了InGaN的组成不稳定区域,并且与NH_3系统相比,在N_2H_4系统中氢对InGaN的组成的影响较小。

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