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Double thermal donors in Czochralski-grown silicon heat-treated under atmospheric and high hydrostatic pressures

机译:切克劳斯基生长的硅中的双热供体在大气压和高静水压力下进行了热处理

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摘要

The formation kinetics of Thermal Double Donors, a dominant family of thermal donors in Czochralski-grown silicon annealed at T < 600 degreesC, is studied in detail. A striking enhancement effect of hydrostatic pressures of about 1 GPa on their formation processes, even in a temperature region of thermal instability of these donor centers at about T = 600 degreesC under normal conditions, is clearly demonstrated. The experimental data obtained in the present work are in agreement with the recent theoretical calculations of oxygen diffusion and agglomeration processes in heat-treated Si. [References: 8]
机译:详细研究了热双供体的形成动力学,该热双供体是在切克劳斯基生长的硅中经T <600℃退火的热供体的主要家族。显然,即使在正常条件下,这些供体中心的热不稳定性温度范围约为T = 600℃,约1 GPa的静水压对其形成过程也具有惊人的增强作用。在目前的工作中获得的实验数据与热处理过的Si中氧扩散和附聚过程的最新理论计算是一致的。 [参考:8]

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