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Energy Level Alignments in Strained-Layer GaInP/AlGaInP Laser Diodes: Model Solid Theory Analysis of Pressure-Photoluminescence Experiments

机译:应变层GaInP / AlGaInP激光二极管中的能级对准:压力光致发光实验的模型固体理论分析

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摘要

We report high-pressure photoluminescence (PL) experiments on GaInP/AlGaInP laser structures and a comprehensive interpretation of the results via calculations based on the Model Solid Theory (MST) of Van de Walle et al. [1, 2]. This methodology allows an accurate description of the band structure and band offsets in complex heterostructures over a wide range of sample compositions and applied pressures. Measurements are performed on Ga_(0.4)In_(0.6)P/(Al_(0.6)Ga_(0.4))_(0.5)In_(0.5)P (nominal compositions) double heterojunction samples having active layers of either 125 or 30 A. The pressure data determine a reliable set of deformation potentials for the three constituent binary compounds in this system, InP, AlP and GaP. Using these deformation potentials and a realistic equation of state, the MST calculation gives a reasonable representation of the observed PL spectra over the full presure range (0 to 5 GPa) studied. The conduction band offset triangle open E_c, valence band offset triangle open E_v, and the bulk bandgap energies are computed in this materials system for a wide variety of conditions. At ambient pressure we find triangle open E_c : triangle open E_v approx= 70 : 30, in accord with the consensus value of the band-offset ration in similar heterostructures. However, our calculations predict band-offset variations with both composition and applied pressure that are non-negligible.
机译:我们报告了基于GaInP / AlGaInP激光器结构的高压光致发光(PL)实验,并通过基于Van de Walle等人的模型固体理论(MST)的计算对结果进行了全面的解释。 [1,2]。这种方法学可以准确描述宽范围的样品成分和施加压力下复杂异质结构中的能带结构和能带偏移。对Ga_(0.4)In_(0.6)P /(Al_(0.6)Ga_(0.4))_(0.5)In_(0.5)P(名义组成)具有125 A或30 A活性层的双异质结样品进行测量。压力数据确定了该系统中三个组成的二元化合物InP,AlP和GaP的一组可靠的变形势。使用这些形变势和真实的状态方程,MST计算可以在研究的整个压力范围(0至5 GPa)中合理表示观察到的PL光谱。在该材料系统中针对各种条件计算了导带偏移三角形开度E_c,价带偏移三角形开度E_v和体带隙能。在环境压力下,我们发现三角开口E_c:三角开口E_v大约= 70:30,这与类似异质结构中带隙比的共识值一致。但是,我们的计算预测带偏移随成分和施加压力的变化是不可忽略的。

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