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Electroless plating of palladium and copper on polypyrrole films

机译:在聚吡咯膜上化学镀钯和铜

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摘要

A novel process for the metallization of polypyrrole (PPY) film surface through consecutive electroless plating of palladium and copper in the complete absence of the SnCl_2 sensitization step was demonstrated. X-ray photoelectron spectroscopy (XPS) technique was used to characterize the polymer surface at each stage of the metallization process. It was found that only the fully reduced PPY film could reduce palladium ions to palladium metal (Pd(0)) in substantial amounts from either the Pd(NO_3)_2 or PdCl_2 acid solution. The palladium metal was necessary for catalyzing the subsequent electroless plating of copper. The reduction of Pd(II) ions in acid solution to Pd(0) on the film furface was accompanied by a simultaneous increase in intrinsic oxidation state and doping level of the film. The copper plating process after the palladium uptake step was highly dependent on the [Pd]/[N] ratio on the film. Through XPS and Auger photoeletron spectroscopy measurements, it was postulated that during the electroless copper plating process, the Cu(II) ions were first reduced to Cu(I) on the PPY flim surface before complete reduction to copper metal.
机译:在完全不存在SnCl_2敏化步骤的情况下,通过钯和铜的连续化学镀,对聚吡咯(PPY)膜表面进行金属化的新方法得到了证明。 X射线光电子能谱(XPS)技术用于表征金属化过程每个阶段的聚合物表面。已发现只有完全还原的PPY膜才能从Pd(NO_3)_2或PdCl_2酸性溶液中将钯离子大量还原为钯金属(Pd(0))。钯金属对于催化随后的铜的化学镀是必需的。酸性溶液中的Pd(II)离子还原为薄膜表面上的Pd(0)的同时,薄膜的固有氧化态和掺杂水平也同时增加。钯吸收步骤后的镀铜工艺高度依赖于膜上的[Pd] / [N]比。通过XPS和俄歇光电子能谱测量,推测在化学镀铜过程中,Cu(II)离子首先在PPY薄膜表面还原为Cu(I),然后完全还原为铜金属。

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