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Analysis of detrapping processes of aromatic 1,3,4-oxadiazoles with thermally stimulated luminescence

机译:芳香族1,3,4-恶二唑类化合物受热激发的去陷阱过程分析

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Thermally stimulated luminescence (TSL), and ultraviolet photoelectron spectroscopy (UPS) measurements have been carried out on Langmuir-Blodgett films of a substituted 1,3,4-oxadiazole. UPS provided the experimental electronic band structure of the investigated material and also parameters like ionisation potential, 7.9 eV, and electron affinity, 4.8 eV. These high values indicate that it can be used as hole blocking/electron transporting layer in emitting devices. Thermally stimulated processes on oxadiazoles thin films have been studied in order to get information about their electronic properties. The fractional glow technique, applied on the thermal stimulated luminescence curves, highlights different peaks. They originate from carrier relaxation processes. We focused our attention on the comlex structure between 120 and 160 K. By the analysis of the curves performed both with the initial rise method and with a fitting procedure, we estimated the activization energy, between 3.5 (initial rise method) and 4 meV (numerical simulation), the frequency factors, 10~4 s~(-1), and a Gaussian trap distribution shape.
机译:已经在取代的1,3,4-恶二唑的Langmuir-Blodgett膜上进行了热激发发光(TSL)和紫外光电子能谱(UPS)测量。 UPS提供了所研究材料的实验电子能带结构,以及诸如电离势7.9 eV和电子亲和力4.8 eV的参数。这些高值表明它可用作发光器件中的空穴阻挡/电子传输层。为了获得有关它们的电子性能的信息,已经研究了在乙二唑薄膜上的热激发过程。在热激发的发光曲线上应用的分数辉光技术可以突出显示不同的峰。它们源自载体松弛过程。我们将注意力集中在120到160 K之间的复杂结构上。通过对使用初始上升方法和拟合程序执行的曲线的分析,我们估计了活化能在3.5(初始上升方法)和4 meV(数值模拟),频率因子10〜4 s〜(-1)和高斯陷阱分布形状。

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