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首页> 外文期刊>Chemical vapor deposition: CVD >Growth of Atomically Smooth Epitaxial Nickel Ferrite Films by Direct Liquid Injection CVD
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Growth of Atomically Smooth Epitaxial Nickel Ferrite Films by Direct Liquid Injection CVD

机译:通过直接液体注入CVD生长原子光滑的外延镍铁氧体薄膜

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Magnetoelectric heterostructures are being actively investigated for utilization in next generation microwave devices such as tunable filters and phase shifters. For efficient microwave absorption and magnetoelectric coupling, relatively thick (>1mm) epitaxial spinel ferrite films with smooth topographies are required for the magnetic/ferroelectric heterostructures. Towards this goal, direct liquid injection (DLI)-CVD has been utilized for epitaxial growth of nickel ferrite (NiFe_2O_4) films on MgAl_2O_4 (100) and MgO (100) substrates with high deposition rates. Anhydrous Ni(acac)_2 and Fe(acac)_3 (acac=acetylacetonate) are used as precursor sources dissolved in N,N-dimethyl formamide for the DLI vaporizer system. The influence of deposition temperature on the film properties has been investigated using optimized process conditions for flow of the injected precursors and oxygen. Epitaxial nickel ferrite films of stoichiometric composition are obtained in the temperature range 500-800 °C on both substrates with growth rates in the range 0.6-1.1 mm h~(-1). Because of changes in the surface diffusion behavior, the film morphology is found to be dependent on the deposition temperature with atomically smooth films being obtained for deposition in the temperature range 600-700 °C. Magnetic measurements reveal an increase in the saturation magnetization for the films with increasing growth temperature, which correlates well with the trend for improved epitaxial growth as indicated by X-ray and Raman spectroscopy measurements. Nickel ferrite films deposited on MgAl_2O_4 (100) at 800 °C exhibit saturation magnetization very close to the bulk value of 300 emu cm~(-3).
机译:磁电异质结构正在积极研究,以用于下一代微波设备,例如可调滤波器和移相器。为了有效地吸收微波和磁电耦合,对于磁/铁电异质结构,需要具有相对较厚(> 1mm)的具有平滑形貌的外延尖晶石铁氧体薄膜。为了实现这一目标,直接液体注入(DLI)-CVD技术已被用于在具有高沉积速率的MgAl_2O_4(100)和MgO(100)衬底上外延生长铁酸镍(NiFe_2O_4)薄膜。将无水Ni(acac)_2和Fe(acac)_3(acac =乙酰丙酮)用作溶解在DLI蒸发器系统的N,N-二甲基甲酰胺中的前体来源。沉积温度对薄膜性能的影响已经使用优化的工艺条件进行了研究,以使注入的前体和氧气流动。在两个基板上在500-800°C的温度范围内获得化学计量组成的外延镍铁氧体薄膜,生长速率在0.6-1.1 mm h〜(-1)范围内。由于表面扩散行为的变化,发现膜的形态取决于沉积温度,在600-700°C的温度范围内可获得原子光滑的膜用于沉积。磁性测量显示出薄膜的饱和磁化强度随生长温度的升高而增加,这与X射线和拉曼光谱测量所表明的改善外延生长的趋势高度相关。在800°C的条件下沉积在MgAl_2O_4(100)上的镍铁氧体薄膜显示出的饱和磁化强度非常接近300 emu cm〜(-3)的体积值。

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