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Effects of multiple BGA rework on strength of solder joints

机译:多次BGA返工对焊点强度的影响

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Purpose - The purpose of this paper is to investigate effects of the multiple rework of ball grid array (BGA) components on mechanical strength of BGA balls, as well as any possible intermetallic (IMC) embrittlement, and obtain data correlated with possible estimation on the maximum permitted limits of BGA rework. Design/methodology/approach - In this paper, mechanical strength of BGA components assemblies with multiple numbers of rework operations was evaluated. Mechanical evaluation was conducted using BGA ball shear tests and four-point bending tests of BGA assemblies. Test samples were prepared under the following conditions: virgin, one, two, three and five BGA reworks. Failure mechanism was evaluated using cross-section and SEM analysis. Findings - The results show that both ball shearing tests and four-point bending tests indicates that strength of BGA solder ball itself was not reduced significantly after repair/rework operation from one to five cycles. The IMC structure layer after rework is a mixture of IMC, Sn-rich and Pb-rich phases. This mixture layers with thickness even more than 10μm in thickness does not show reduction of strength of BGA solder balls and do not cause premature embrittlement. However, the bonding strength of the copper pads to the laminates is reduced with rework/repair operation, with the great reduction coming from the first and second rework operation. Practical implications - In general, the industry recommends two rework cycles for BGA components on the same spot. This study indicates that further rework (up to five) causes little degradation, therefore there is room to increase the total rework cycle limit beyond recommended two for plastic BGA components. Originality/value - Presented test results shows that in most cases industry overestimates risks associated with increased embritlement of the BGA solder joints due to the intermetallics growth after multiple BGA rework operations. Strength reduction of BGA assemblies is mostly associated with reduction of bonding strength of the copper pads to the laminates is reduced with rework/repair operation and number of reworks could be increased in most cases.
机译:目的-本文的目的是研究球栅阵列(BGA)组件的多次返工对BGA球的机械强度以及任何可能的金属间(IMC)脆化的影响,并获得与可能的估计相关的数据。 BGA返工的最大允许限制。设计/方法/方法-在本文中,对具有多次返工操作的BGA组件的机械强度进行了评估。使用BGA球剪切测试和BGA组件的四点弯曲测试进行机械评估。在以下条件下制备测试样品:原始,一次,两次,三次和五次BGA返工。使用横截面和SEM分析评估失效机理。结果-结果表明,球剪切试验和四点弯曲试验均表明,BGA焊球本身的强度在维修/返工操作从一到五个循环后并未显着降低。返工后的IMC结构层是IMC,富锡和富铅相的混合物。厚度甚至超过10μm的这种混合层不会显示BGA焊球的强度降低,也不会引起过早的脆化。然而,通过返工/维修操作降低了铜焊盘与层压板的结合强度,其中很大的降低来自于第一和第二返工操作。实际意义-业界通常建议在同一位置对BGA组件进行两个返工周期。这项研究表明,进一步的返工(最多5个)几乎不会导致性能下降,因此,对于塑料BGA组件,总的返工周期极限有超过建议的2个的余地。原创性/价值-提出的测试结果表明,在大多数情况下,由于多次BGA返工操作后金属间化合物的增长,行业内高估了与BGA焊点脆化程度相关的风险。 BGA组件的强度降低主要与铜焊盘与层压板的粘合强度降低有关,因为返工/维修操作会降低,在大多数情况下返工数量可能会增加。

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