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Comparison of Various Methods for Transferring Graphene and Few Layer Graphene Grown by Chemical Vapor Deposition to an Insulating SiO_2/Si Substrate

机译:化学气相沉积生长石墨烯和少量层石墨烯转移到绝缘SiO_2 / Si衬底上的各种方法的比较

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The objective of this study is to compare the results of transferring graphene and few layer graphene (FKG) up to 5 nm thick, grown by chemical vapor deposition (CVD) at a reduced pressure to a SiO_2/Si substrate using four different polymer films. The chosen transfer methods are based on the most promising (according to published data) materials: polymethyl methacrylate, polydimethylsiloxane, thermoscotch, and polycarbonate. It is shown that the most promising transfer method (minimum resistance and maximum carrier mobility) lies in the use of polycarbonate thin films with their dissolution in chloroform. In this case, the following parameters are steadily obtained: the graphene and FLG resistance is 250–900 Ω/□ and the carrier mobility is 900–2500 cm~2/(V s).
机译:这项研究的目的是比较通过使用四种不同的聚合物薄膜在减压下通过化学气相沉积(CVD)生长到5 nm厚的石墨烯和几层石墨烯(FKG)到SiO_2 / Si衬底上的结果。选择的转移方法基于最有前途的(根据公开数据)材料:聚甲基丙烯酸甲酯,聚二甲基硅氧烷,热固性和聚碳酸酯。结果表明,最有希望的转移方法(最小电阻和最大载流子迁移率)在于使用聚碳酸酯薄膜,并将其溶解在氯仿中。在这种情况下,将稳定获得以下参数:石墨烯和FLG电阻为250-900Ω/□,载流子迁移率为900-2500 cm〜2 /(V s)。

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