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Effective Electron Mass in Heavily Doped GaAs in the Ordering of Impurity Complexes

机译:重掺杂GaAs中杂质电子的有效电子质量

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摘要

Spectra of edge photoluminescence (PL) at 300 K have been studied in a set of Czochralski-grown Te-doped GaAs single crystals with a free carrier density of n_0 = 10~(17) - 10~(19) cm~(-3). The carrier density dependences of the chemical potential and band gap narrowing are obtained by analyzing the PL spectral line profiles. The dependence of the effective mass of electrons at the bottom of the conduction band on their density, m_0 (n_0), is calculated. It is shown that the nonmonotonic m_0 (n_0) dependence correlates with data on electron scattering in the material under study and results from the ordering of impurity complexes.
机译:在一组切克劳斯基生长的掺Te的GaAs单晶中研究了300 K下的边缘光致发光光谱,其自由载流子密度为n_0 = 10〜(17)-10〜(19)cm〜(-3) )。通过分析PL光谱线分布图,获得化学势和带隙变窄的载流子密度依赖性。计算了导带底部电子的有效质量与其密度m_0(n_0)的关系。结果表明,非单调的m_0(n_0)依赖关系与所研究材料中电子散射的数据相关,并且是由杂质配合物的排序导致的。

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