Bi_2Te_(3-x)Se)_x (x = 0.04) nanocrystal formation

摘要

The results of experimental researches dealing with formation of nanometric-size doped (Ag) layers on the surface (0001) between Te~((1))-Te~((1)) telluride quintet layers in Bi_2Te_(3-x)Se)_x (x = 0.04) crystals under directed crystallization has been submitted. During the crystal growth as result of impurity diffusion along a surface (0001), accumulation, redistribution and nanocrystal formation between Te~((1))-Te~((1)) layers occur. By the method of atomic-force microscopy, the Bi_2Te_(3-x)Se_x crystal images with nanolayers were obtained. Being based on experimental data, the fractal dimension of nanocrystalline layers was estimated.