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COLOUR SENSORS BASED ON ACTIVE INTERFERENCE FILTERS USING SILICON-COMPATIBLE MATERIALS

机译:使用硅兼容材料的基于有源干扰滤波器的颜色传感器

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Multilayer stacks of dielectric materials and polycrystalline silicon (with photodiodes therein) deposited on a silicon substrate can be used to result in an 'active' structure that filters and detects light in its 'active' regions at the same time. Such a structure can be employed to design optical detectors with a programmable spectral response by weighted summing of the photocurrents supplied by polysilicon and monocrystalline silicon photodiodes. Such thin-film colour sensors provide improved response flexibility and fabrication compatibility with standard microelectronic processing. Furthermore, such a realization facilitates the implementation of on-chip smart colour-imaging sensors and features efficient area occupation by vertical stacking of the colour detectors. This paper presents the design methods, the fabrication and the characterization of such a device. Results of the measured optical properties of the available silicon-compatible materials are also presented, together with the practical considerations required to implement photodetectors in polysilicon. The measurement results of a fabricated colour sensor indicate that sufficient spectral selectivity can be achieved. (C) 1997 Elsevier Science S.A. [References: 25]
机译:介电材料和沉积在硅基板上的多晶硅(其中有光电二极管)的多层堆叠可用于形成“有源”结构,该结构同时过滤并检测其“有源”区域中的光。通过对多晶硅和单晶硅光电二极管提供的光电流进行加权求和,可以将这种结构用于设计具有可编程光谱响应的光学检测器。这样的薄膜颜色传感器提供了改进的响应灵活性以及与标准微电子处理的制造兼容性。此外,这种实现方式促进了片上智能彩色成像传感器的实现,并且具有通过垂直堆叠彩色检测器而有效占用面积的特征。本文介绍了这种器件的设计方法,制造和特性。还介绍了可用的硅兼容材料的光学性能测量结果,以及在多晶硅中实现光电探测器所需的实际考虑。制成的颜色传感器的测量结果表明可以实现足够的光谱选择性。 (C)1997 Elsevier Science S.A. [参考:25]

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