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Frontside bulk silicon micromachining using porous-silicon technology

机译:使用多孔硅技术的正面体硅微加工

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摘要

Porous-silicon technology is successfully used for frontside bulk silicon micromachining in a process which is fully C-MOS compatible. Porous silicon is used as a sacrificial layer and it is removed by C-MOS-compatible chemicals, leaving a very smooth bottom surface and sidewalls. Deep trenches, bridges with suspended membranes and cantilevers are formed, which open new possibilities in monolithic integration of sensors with electronics. Cavities as deep as ~ 120 p,m and suspended polysilicon membranes with a fiat surface as large as 230 μm × 550 μm have been fabricated by this process. Also other micromechanical structures such as very fiat polysilicon cantilevers of dimensions 850μm ×2μm are easily obtained after optimization of the process in order to minimize the strain within the polysilicon films. #1998 Elsevier Science S.A.
机译:多孔硅技术已被成功用于完全C-MOS兼容的正面批量硅微加工。多孔硅用作牺牲层,并通过与C-MOS兼容的化学物质去除,从而形成了非常光滑的底面和侧壁。形成了深沟,带有悬浮膜的桥和悬臂,这为传感器与电子器件的整体集成开辟了新的可能性。通过这种工艺,可以制造出深度约为120 p.m的型腔以及表面面积高达230μm×550μm的悬浮多晶硅膜。在优化工艺之后,还可以轻松获得其他微机械结构,例如尺寸为850μm×2μm的非常平坦的多晶硅悬臂,以最小化多晶硅膜内的应变。 #1998 Elsevier Science S.A.

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