首页> 外文期刊>Optik: Zeitschrift fur Licht- und Elektronenoptik: = Journal for Light-and Electronoptic >Time-resolved photoluminescence studies of InGaN/GaN multi-quantum-wells blue and green light-emitting diodes at room temperature
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Time-resolved photoluminescence studies of InGaN/GaN multi-quantum-wells blue and green light-emitting diodes at room temperature

机译:室温下InGaN / GaN多量子阱蓝色和绿色发光二极管的时间分辨光致发光研究

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摘要

Time-resolved photoluminescence (TRPL) of the blue and green LEDs, which has the same number of quantum-well (QW) pairs and the different etched depths, has been studied at room temperature. The purpose is to analyze the effect of different indium (In) content and defects density on TRPL. The carrier lifetime of radiative recombination and non-radiative for blue LED (In = 0.15) is 625.0 ns and 55.6 ns, and for green ones (In = 0.21), the figure is 363.6 ns and 35.0 ns. The carrier lifetime is reduced along with the increasing of In-component. As the etched depth deepened of blue LED, the non-radiative recombination lifetime tends to infinity. When it comes to low indium content, the PL spectra present a blue shift. With the increasing of indium mole fraction, the blue shift appeared at first, and then a red shift has been observed. And the spectral shift has disappeared, while etching the LEDs. At last, we clarify the results, through the band bending caused by polarization electric field. (C) 2015 Elsevier GmbH. All rights reserved.
机译:在室温下研究了具有相同数量的量子阱(QW)对和不同蚀刻深度的蓝色和绿色LED的时间分辨光致发光(TRPL)。目的是分析不同的铟(In)含量和缺陷密度对TRPL的影响。蓝色LED(In = 0.15)的辐射复合和非辐射载流子寿命分别为625.0 ns和55.6 ns,绿色LED(In = 0.21)的载流子寿命为363.6 ns和35.0 ns。随着In-组分的增加,载流子寿命减少。随着蓝色LED蚀刻深度的加深,非辐射复合寿命趋于无限。当铟含量低时,PL光谱呈现蓝移。随着铟摩尔分数的增加,首先出现蓝移,然后观察到红移。蚀刻LED时,光谱偏移消失了。最后,我们通过极化电场引起的能带弯曲来澄清结果。 (C)2015 Elsevier GmbH。版权所有。

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