Switch-level test-vector generation for CMOS combinational logic

摘要

A method is proposed of test-vector generation for stuck-open and other faults in CMOS combinational circuits represented at the switch level. It consists in solving three problems: (1) Identify a stimulus that should be applied to the element under test. (2) Trace a path through which the response could reach an output node. (3) Find a set of input values that could drive internal nodes to logic levels determined in solving problems (1) and (2). The method is illustrated with an example.