Detection threshold in muscovite mica: Influence of the observation tool

摘要

For the observation of nuclear tracks, Atomic Force Microscopy (AFM) is a useful technique. In our study, we have irradiated a muscovite mica sample using 600 keV oxygen ions. This ion's energy is well below the detection threshold predicted by the existing models. The samples were visualized at high resolution with an AFM device. Before chemical etching no tracks were visualized on the surface at an atomic level. However, defects must have been initiated because tracks became observable after a brief etching time. Our results confirm that the detection threshold is influenced by the observation tool. In this article we provide information concerning the "observability" and "etchability" of latent tracks. [References: 12]