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Deterministic arbitrary switching of polarization in a ferroelectric thin film

机译:铁电薄膜中极化的确定性任意切换

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Ferroelectrics have been used as memory storage devices, with an upper bound on the total possible memory levels generally dictated by the number of degenerate states allowed by the symmetry of the ferroelectric phase. Here, we introduce a new concept for storage wherein the polarization can be rotated arbitrarily, effectively decoupling it from the crystallographic symmetry of the ferroelectric phase on the mesoscale. By using a Bi5Ti3FeO15-CoFe2O4 film and via Band-Excitation Piezoresponse Force Microscopy, we show the ability to arbitrarily rotate polarization, create a spectrum of switched states, and suggest the reason for polarization rotation is an abundance of sub-50 nm nanodomains. Transmission electron microscopy-based strain mapping confirms significant local strain undulations imparted on the matrix by the CoFe2O4 inclusions, which causes significant local disorder. These experiments point to controlled tuning of polarization rotation in a standard ferroelectric, and hence the potential to greatly extend the attainable densities for ferroelectric memories.
机译:铁电体已经被用作存储器存储设备,总的可能的存储水平的上限通常由铁电相的对称性所允许的简并状态数来决定。在这里,我们引入了一种新的存储概念,其中极化可以任意旋转,从而有效地将其与中尺度上铁电相的晶体对称性解耦。通过使用Bi5Ti3FeO15-CoFe2O4膜并通过带激压电响应力显微镜,我们显示了任意旋转偏振,创建开关态光谱的能力,并暗示了偏振旋转的原因是亚50纳米纳米域的丰度。基于透射电子显微镜的应变图确认了CoFe2O4夹杂物在基体上产生的显着局部应变起伏,这会引起显着的局部紊乱。这些实验指出了标准铁电体中极化旋转的受控调谐,因此有可能极大地扩展铁电存储器可达到的密度。

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