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首页> 外文期刊>Nanoscience and Nanotechnology Letters >Design and Growth Optimization by Dual Ion Beam Sputtered ZnO-Based High-Efficiency Multiple Quantum Well Green Light Emitting Diode
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Design and Growth Optimization by Dual Ion Beam Sputtered ZnO-Based High-Efficiency Multiple Quantum Well Green Light Emitting Diode

机译:双离子束溅射ZnO基高效多量子阱绿色发光二极管的设计和生长优化

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摘要

This manuscript deals with a theoretical design of Cd_(0.4)Zn_(0.6)O/ZnO multiple quantum well light emitting diode using commercial simulation software and experimentally optimized growth conditions of n-type ZnO on Si (001) substrate by dual ion beam sputtering deposition system. Theoretical study reveals an internal quantum efficiency ~93.5% is achieved at room temperature from the device, emitting at 510 nm with a turn-on voltage of 3 V. The effect of substrate temperature on ZnO thin film has been investigated. Growth parameters optimization is performed using structural, electrical, optical and morphological characterizations. X-ray diffraction measurement show that the ZnO films grown at substrate temperatures of 200℃, 400℃ and 600℃ have a (002) preferred orientation. Four probe Hall measurements demonstrate achievements of a maximum carrier mobility of 26.53 cm~2/V · s with a low electrical resistivity of 0.062 Ω · cm and a carrier concentration of 3.8 × 10~(18) cm~(-3) at room temperature for the film grown at 500℃. Photoluminescence studies conducted at room temperature describe a strong band-edge emission at 380 nm from ZnO samples. Prominent photoluminescence shoulder peaks are observed at ~485 nm and 618 nm from ZnO film grown at 400℃.
机译:该手稿使用商业仿真软件处理了Cd_(0.4)Zn_(0.6)O / ZnO多量子阱发光二极管的理论设计,并通过双离子束溅射实验地优化了Si(001)衬底上n型ZnO的生长条件。沉积系统。理论研究表明,在室温下,该器件在510 nm处以3 V的开启电压发射时,内部量子效率约为93.5%。研究了衬底温度对ZnO薄膜的影响。使用结构,电,光学和形态学表征进行生长参数优化。 X射线衍射测量表明,在200℃,400℃和600℃的衬底温度下生长的ZnO薄膜具有(002)择优取向。四个探头霍尔测量结果表明,在室温下,最大载流子迁移率达到26.53 cm〜2 / V·s,电阻率低至0.062Ω·cm,载流子浓度达到3.8×10〜(18)cm〜(-3)在500℃下生长的膜的温度。在室温下进行的光致发光研究表明,ZnO样品在380 nm处有很强的边沿发射。在400℃下生长的ZnO薄膜在〜485 nm和618 nm处观察到明显的光致发光肩峰。

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