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Enhanced visible photoluminescence from ultrathin ZnO films grown on Si-nanowires by atomic layer deposition

机译:通过原子层沉积在硅纳米线上生长的超薄ZnO薄膜增强了可见光致发光

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摘要

Bright room temperature visible emission is obtained in heterostructures consisting of ~3.5 nm thick ZnO ultrathin films grown on Si-nanowires produced by means of self-masking dry etching in hydrogen-containing plasma. The ZnO films were deposited on Si-nanowires by using atomic layer deposition (ALD) under an ambient temperature of 25 °C. The orders of magnitude enhancement in the intensity of the room temperature photoluminescence peaked around 560 nm in the present ZnO/Si-nanowire heterostructures is presumably due to the high aspect (surface/volume) ratio inherent to the Si-nanowires, which has, in turn, allowed considerably more ZnO material to be grown on the template and led to markedly more efficient visible emission. Moreover, the ordered nanowire structure also features an extremely low reflectance (~0.15%) at 325 nm, which may further enhance the efficiency of emission by effectively trapping the excitation light.
机译:在异质结构中获得了明亮的室温可见光发射,该异质结构由在含氢等离子体中通过自掩膜干法刻蚀产生的Si-纳米线上生长的〜3.5 nm厚的ZnO超薄膜组成。通过在25°C的环境温度下使用原子层沉积(ALD)将ZnO膜沉积在Si-纳米线上。在当前的ZnO / Si-纳米线异质结构中,室温光致发光强度峰值达到560 nm的数量级增强,大概是由于Si-纳米线固有的高纵横比(表面/体积)所致。反过来,允许更多的ZnO材料在模板上生长,并导致明显更有效的可见光发射。此外,有序的纳米线结构还具有在325 nm处极低的反射率(约0.15%),可通过有效捕获激发光来进一步提高发射效率。

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