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Photoluminescence study of MOCVD-grown GaN/AlGaN MQW nanostructures: influence of Al composition and Si doping

机译:MOCVD生长的GaN / AlGaN MQW纳米结构的光致发光研究:Al组成和Si掺杂的影响

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A detailed study of low-temperature photoluminescence (PL) in GaN/AlGaN multiple quantum well (MQW) nanostructures has been reported. We have investigated the effect of Si doping and Al content on PL spectra and PL decay time of these structures. The temperature dependence of radiative as well as non-radiative lifetimes have been evaluated between 2 K and room temperature for different Si doping. We found that radiative recombination at higher temperatures even up to RT is stronger in the doped sample, compared to the undoped one. Hole localization in GaN/AlGaN MQWs with different compositions of Al is demonstrated via PL transient decay times and LO phonon coupling. It is found that there is an increasing of the decay time at the PL peak emission with increasing Al composition. For the undoped sample, a non-exponential PL decay behaviour at 2 K is attributed to localized exciton recombination. A slight upshift in QWs PL peak with increasing Al composition is observed, which is counteracted by the expected rise of the internal QW electric field with increasing Al. The localization energies have been evaluated by studying the variation of the QW emission versus temperature and we found out that the localization energy increases with increasing Al composition.
机译:报道了对GaN / AlGaN多量子阱(MQW)纳米结构中的低温光致发光(PL)的详细研究。我们已经研究了硅掺杂和铝含量对这些结构的PL光谱和PL衰减时间的影响。对于不同的Si掺杂,已经评估了辐射寿命和非辐射寿命的温度依赖性,介于2 K和室温之间。我们发现,与未掺杂样品相比,在掺杂样品中,即使在高达RT的高温下,辐射的复合作用也更强。通过PL瞬态衰减时间和LO声子耦合证明了具有不同Al成分的GaN / AlGaN MQW中的空穴定位。发现随着Al成分的增加,在PL峰发射处的衰减时间增加。对于未掺杂的样品,在2 K处的非指数PL衰减行为归因于局部激子复合。观察到随着Al含量的增加,QWs PL峰有轻微的上移,这被内部QW电场随Al的增加的预期抵消。通过研究QW发射随温度的变化来评估定位能,我们发现定位能随着Al组成的增加而增加。

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