A Mechanical Model of the Contact Interaction between the Atomic Force Microscope Measuring Element and a Surface under Investigation

摘要

A hierarchic set of gradually complicated models is suggested. The models describe the contact condition of the mechanical interaction between the atomic force microscope (AFM) probe and the investigated surface while allowing for various factors. A variant of the AFM probe—surface mechanical interaction model is developed which takes into account the simultaneous effect of the probe geometry and the elastic deformations of the AFM cantilever that take place when there is a small or moderate curvature of surfaces under study. A variant of the model of interaction between the AFM probe and the surface of the investigated specimen is discussed, taking into consideration the simultaneous effect of the probe geometry and elastic deformations of the AFM cantilever and the probe contact with the surface under study within the framework of Derjaguin—Muller—Toropov model. Algorithms to determine the AFM probe position are created to optimize computations.