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2D quantum mechanical device modeling and simulation: Centre-channel (CC) and double-gate (DG) MOSFET

机译:二维量子机械器件建模与仿真:中心沟道(CC)和双栅(DG)MOSFET

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摘要

In this paper, a novel device structure (Si1-xGex/Si/Si1-xGex hetero-structure), which is named as "center-channel (CC) double-gate (DG) MOSFET," is proposed. Device performance of the proposed FET structure was investigated with our two-dimensional quantum-mechanical simulator which produces a self-consistent solution of Poisson-Schrodinger equations and the current continuity equation. The CC operation of CC-NMOS is confirmed from the electron density distribution and the band lineups as well as the lowest energy wave function. Current-voltage characteristics including the trans-conductance (G(m)) of CC-MOSFET are carefully compared with those of the conventional DG-NMOS to evaluate the distinct feature of the proposed FET structure. Our simulation revealed that the proposed FET demonstrates the enhanced (about (similar to 1.6x) current drive and 60% G(m). Finally, the short-channel effects of CC and DG MOSFET, both of which demonstrate excellent subthreshold behaviors and open the possibility of device scaling down to sub-20 nm.
机译:本文提出了一种新型的器件结构(Si1-xGex / Si / Si1-xGex异质结构),称为“中心沟道(CC)双栅(DG)MOSFET”。我们的二维量子力学模拟器研究了拟议的FET结构的器件性能,该模拟器产生了Poisson-Schrodinger方程和电流连续性方程的自洽解。从电子密度分布和能带排列以及最低的能量波函数可以确认CC-NMOS的CC操作。将包括CC-MOSFET的跨导(G(m))的电流-电压特性与常规DG-NMOS的电流-电压特性进行了仔细比较,以评估所提出的FET结构的独特特性。我们的仿真表明,所提出的FET表现出增强的(大约(约1.6倍)电流驱动和60%G(m)的效果),最后,CC和DG MOSFET的短沟道效应均表现出出色的亚阈值性能和开路器件缩小至20 nm以下的可能性。

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