首页> 外国专利> Single electron transistor with controllable quantum dot size, an integration of single electron transistor and double-gate MOSFET, and fabrication method thereof, respectively

Single electron transistor with controllable quantum dot size, an integration of single electron transistor and double-gate MOSFET, and fabrication method thereof, respectively

机译:量子点尺寸可控的单电子晶体管,单电子晶体管与双栅MOSFET的集成及其制造方法

摘要

PURPOSE: A single electron transistor is provided to control the size of a quantum dot by forming the first gate on the sidewall of a channel and by adjusting the height of the first gate left on the sidewall of the channel in etching the first gate material. CONSTITUTION: An insulator is formed on a substrate support unit. Source and drain regions are formed of single crystalline silicon, separated from each other on the insulator. A channel formed of single crystalline silicon is formed on the insulator, connected to the source region and the drain region. The first insulation layer is deposited on the channel and a part of the source and drain regions in a straight line with the channel. The first gate insulation layer(36) is deposited on both sidewalls of the channel and on the sidewall of the source and drain regions. The first gate(37) is formed on a part of both sidewalls of the channel over the first gate insulation layer and on the sidewall of the source and drain. The second gate insulation layer(38) is deposited on the first gate and a part of both sidewalls of the channel wherein the first gate is not formed. The second gate(39) surrounds the channel over the second gate insulation layer and the first insulation layer, formed between the source and drain regions.
机译:目的:提供一个单电子晶体管,以通过在沟道的侧壁上形成第一栅极并通过在蚀刻第一栅极材料时调节留在沟道的侧壁上的第一栅极的高度来控制量子点的大小。构成:在基板支撑单元上形成绝缘体。源极和漏极区域由单晶硅形成,在绝缘体上彼此分离。由单晶硅形成的沟道形成在绝缘体上,并连接到源极区和漏极区。第一绝缘层沉积在沟道上以及与沟道成一直线的一部分源极和漏极区域上。第一栅极绝缘层(36)沉积在沟道的两个侧壁上以及源极和漏极区域的侧壁上。第一栅极(37)形成在第一栅极绝缘层上方的沟道的两个侧壁的一部分上以及源极和漏极的侧壁上。第二栅极绝缘层(38)沉积在第一栅极和沟道的两个侧壁的其中未形成第一栅极的一部分上。第二栅极(39)围绕在源极和漏极区域之间形成的第二栅极绝缘层和第一绝缘层上方的沟道。

著录项

  • 公开/公告号KR100517126B1

    专利类型

  • 公开/公告日2005-10-18

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20030025110

  • 发明设计人 박병국;이종덕;우동수;

    申请日2003-04-21

  • 分类号H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 22:03:23

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