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Comparison of measurement methods for microsystem components: application to microstructures made by the deep x-ray lithography process (x-ray LIGA)

机译:微系统组件的测量方法比较:在深X射线光刻工艺(X射线LIGA)制成的微结构中的应用

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摘要

The LIGA (a German acronym for lithography, electroplating and molding) process using highly parallel x-rays permits the production of a microstructure with still unique characteristics: high aspect ratio, high accuracy, high perpendicularity and lower roughness of the side wall. From a marketing point of view, this qualitative description might suffice to attract users to the technology. Regarding widespread commercialization and standardization of x-ray LIGA products, our goal is to establish a rigorous dimensional metrology for which we need to understand and quantify uncertainty, which is the key to accuracy. We report on our metrological study using a coordinate measurement machine (CMM) equipped with a fibre probe (3D measurements) which will be compared to two versions of lateral top-view measurements (2D/surface measurements): an optical microscope provided with a micrometric table and a CMM with an image processing sensor; these two types of measurement methods being complementary. In fact, microsystem technology requires measurements to be performed with precision and accuracy within the range of 0.1 (mu)m. In this paper, we present an analysis and a discussion of both types of measurement systems. The precision and reproducibility of the CMM (with fibre probe) during a two-year study will be exposed; a calibrated series part is being measured every time the machine is used. In this case, the CMM is used as a comparator. Its accuracy and the calibration of the ball diameter using an etalon (ceramic gage block) will be exposed. Furthermore, by taking into account the results obtained by the measurement system analysis (MSA), we will show the measurement's impact on the process by taking as an example the fabrication of mm gold gears for watch industry; a quantitative description of process reproducibility and of the influence of processing parameters influence will be possible in the future.
机译:使用高度平行的X射线的LIGA(德国是光刻,电镀和成型的首字母缩写)工艺可以生产出具有独特特征的微结构:高纵横比,高精度,高垂直度和较低的侧壁粗糙度。从营销的角度来看,这种定性描述足以吸引用户使用该技术。关于X射线LIGA产品的广泛商业化和标准化,我们的目标是建立一个严格的尺寸度量衡,我们需要对其进行理解和量化,这是准确性的关键。我们使用配备有光纤探头(3D测量)的坐标测量机(CMM)报告我们的计量研究,该坐标测量机将与两个侧面顶视测量(2D /表面测量)版本进行比较:配备测微仪的光学显微镜桌子和带有图像处理传感器的CMM;这两种测量方法是相辅相成的。实际上,微系统技术要求以0.1μm范围内的精度和精确度进行测量。在本文中,我们对两种类型的测量系统进行了分析和讨论。在为期两年的研究中,将展示CMM(带有光纤探头)的精度和可重复性。每次使用机器时,都会测量经过校准的系列零件。在这种情况下,CMM用作比较器。将展示其精度以及使用标准具(陶瓷量具)对球直径的校准。此外,通过考虑通过测量系统分析(MSA)获得的结果,我们将以制造钟表行业的毫米金齿轮为例,说明测量对过程的影响。将来有可能对过程的可重复性和过程参数的影响进行定量描述。

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