首页> 美国卫生研究院文献>International Journal of Pharmaceutics: X >The use of X-ray microtomography to investigate the microstructure of pharmaceutical tablets: Potentials and comparison to common physical methods
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The use of X-ray microtomography to investigate the microstructure of pharmaceutical tablets: Potentials and comparison to common physical methods

机译:使用X射线显微镜监测来研究药物片剂的微观结构:潜在的含量和与常见物理方法的比较

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摘要

Within this study, tablets microstructure was investigated by X-ray microtomgraphy. The aim was to gain information about their microstructure, and thus, derive deeper interpretation of tablet properties (mechanical strength, component distribution) and qualified property functions. Challenges in image processing are discussed for the correct identification of solids and voids. Furthermore, XMT measurements are critically compared with complementary physical methods for characterizing active pharmaceutical ingredient (API) content and porosity and its distribution (mercury porosimetry, calculated tablet porosity, Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM)). The derived porosity by XMT is generally lower than the calculated porosity based on geometrical data due to the resolution of the XMT in relation to the pore sizes in tablets. With rising compactions stress and API concentration, deviations between the actual and the calculated API decrease. XMT showed that API clusters are present for all tablets containing >1 wt% of ibuprofen. The 3D orientation of the components is assessable by deriving cord lengths along all dimensions of the tablets. An increasing compaction stress leads to rising cord lengths, showing higher connectivity of the respective material. Its lesser extent in the z-direction illustrates the anisotropy of the compaction process. Additionally, cracks in the fabric are identified in tablets without visible macroscopic damage. Finally, the application of XMT provides valuable structural insights if its limitations are taken into account and its strengths are fostered by advanced pre- and post-processing.
机译:在该研究中,通过X射线微量射孔研究了片剂微观结构。目的是获取有关其微观结构的信息,从而获得更深入地解释片剂性质(机械强度,部件分布)和合格的财产功能。讨论了图像处理中的挑战,用于正确识别固体和空隙。此外,与表征活性药物成分(API)含量(API)含量(API)含量(汞孔隙率,计算的片剂孔隙率,聚焦离子束扫描电子显微镜(FIB-SEM)的互补物理方法,XMT测量与互补的物理方法进行了统治性。由于XMT的分辨率与片剂中的孔径有关的分辨率,通过XMT的衍生孔隙率通常低于基于几何数据的计算孔隙率。随着作用压力和API浓度上升,实际和计算的API之间的偏差减少。 XMT显示API簇存在于含有> 1wt%的布洛芬的所有片剂。通过沿着片剂的所有尺寸推导绳索长度来评估组件的3D取向。增加的压缩应力导致绳索长度上升,显示相应材料的较高连接性。 z方向上的较小程度示出了压实过程的各向异性。另外,织物中的裂缝在片剂中鉴定在没有可见的宏观损伤的片剂中。最后,如果考虑到其限制,XMT的应用提供了有价值的结构见解,并且通过先进的预处理促进其优势。

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