首页> 外文期刊>Modern Physics Letters, B. Condensed Matter Physics, Statistical Physics, Applied Physics >Hydrogen co-doping in III-V semiconductors: Dopant passivation and carbon reactivation kinetics in C-GaAs
【24h】

Hydrogen co-doping in III-V semiconductors: Dopant passivation and carbon reactivation kinetics in C-GaAs

机译:III-V半导体中的氢共掺杂:C-GaAs中的掺杂剂钝化和碳再活化动力学

获取原文
获取原文并翻译 | 示例
           

摘要

Hydrogen in semiconductors is an electrically active impurity whose interaction with lattice point defects and impurities, might produce a strong modification on their physical behavior, changing some material properties, influencing as well, device performance. In this work we will review the main effects of hydrogen co-doping on the properties crystalline semiconductors, discuss on the driving force on the process of hydrogen incorporation in carbon doped GaAs, grown in the presence of hydrogen. A detailed model on the carbon reactivation kinetics, carbon, doping efficiency and carbon-hydrogen complexes behavior in MOCVD-GaAs epitaxial layers will be presented. Finally, we will discuss die probable relation between the beta evolution of the high frequency and high power n-GaInP/p-GaAs-GaAs hetero-junction bipolar transistor (HBT), and the hydrogen co-doping of the C:GaAs, constituting its base. [References: 16]
机译:半导体中的氢是一种电活性杂质,其与晶格点缺陷和杂质的相互作用可能会对它们的物理行为产生强烈的影响,从而改变某些材料特性,并影响器件性能。在这项工作中,我们将回顾氢共掺杂对晶体半导体特性的主要影响,并讨论在氢存在下生长的碳掺杂GaAs中氢掺入过程的驱动力。将提供有关MOCVD-GaAs外延层中碳的活化动力学,碳,掺杂效率和碳氢络合物行为的详细模型。最后,我们将讨论高频和高功率n-GaInP / p-GaAs / n-GaAs异质结双极晶体管(HBT)的Beta演化与C:GaAs的氢共掺杂之间的可能关系,构成其基础。 [参考:16]

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号