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High aspect ratio micromachining by synchrotron radiation direct photo-etching

机译:同步辐射直接光刻法进行高深宽比微加工

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摘要

We have carried out micromachining of Teflonpolymers such as PTFE, PFA and FEP as well asoptical crystal such as NaCl and LiF by synchrotron radiation direct (without any chemicals)photo-etching and succeeded in creating microstructures with very high aspect ratios. The maximumaspect-ratio achieved was 50 and the maximum processing depth was 1500 microns. Dependence ofthe etching rate on the synchrotron beam current and on the substrate temperature was studied.Based on the study, we could use only x-rays from the synchrotron radiation so as to apply x-raylithography technology (such as using an x-ray mask and processing in He atmosphere) to ourprocess. A rise in the sample temperature results in significant enhancement of the etching rate. Theetching rate measured was on the order of a few 100μm/min. So that this process is much fasterthan hard x-ray deep lithography for the processing of more than 100μm deep microstructures.
机译:我们已经通过同步加速辐射直接(无任何化学物)光蚀刻对特氟龙聚合物(例如PTFE,PFA和FEP)以及光学晶体(例如NaCl和LiF)进行了微加工,并成功创建了具有非常高纵横比的微结构。达到的最大纵横比为50,最大加工深度为1500微米。研究了腐蚀速率对同步辐射束电流和衬底温度的依赖关系。在此基础上,我们只能使用同步辐射产生的X射线,从而应用X射线光刻技术(例如使用X射线掩模)并在He气氛中进行处理)。样品温度的升高导致蚀刻速率的显着提高。测得的蚀刻速率约为几百微米/分钟。因此,对于处理超过100μm的深层微观结构,此过程比硬X射线深层光刻要快得多。

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