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RF-MEMS packaging by using quartz caps and epoxy polymers

机译:使用石英帽和环氧聚合物进行RF-MEMS封装

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摘要

This work reports on RF MEMS chip capping to protect sensitive devices by quartz caps having a cavity to enclose MEMS devices and an epoxy film polymer as a sealing ring. Full hermeticity is not possible due to the permeability of polymer but the goal to protect the mobile parts of the devices during dicing and assembling was achieved. Good RF MEMS devices are produced by die-to-die bonding and a reliable fabrication process is defined while wafer-to-wafer process still needs improvement to increase the fabrication yield. In this paper the fabrication process for both die-to-die and wafer-to-wafer 0-level capping is presented. Good adhesion of caps to the substrate is demonstrated by shear tests, while RF measurements on CPW lines indicate a negligible insertion loss increase. Capping of both capacitive and ohmic contact switches is reported showing no loss of functionality but a modification of actuation voltage induced by thermal treatment.
机译:这项工作报道了RF MEMS芯片的封盖,该保护是通过石英盖来保护敏感器件的,石英盖具有用于封闭MEMS器件的空腔和环氧膜聚合物作为密封环。由于聚合物的渗透性,不可能完全密封,但是达到了在切割和组装过程中保护器件的活动部件的目的。良好的RF MEMS器件是通过管芯之间的键合生产的,并且定义了可靠的制造工艺,而晶片对晶片的工艺仍需要改进以提高制造良率。本文介绍了芯片到芯片和晶圆到晶圆0级封盖的制造工艺。帽盖与基材的良好粘合力通过剪切试验证明,而CPW线上的RF测量表明插入损耗的增加可忽略不计。据报道,电容式和欧姆式接触开关的封盖均未显示功能损失,而是热处理引起的驱动电压发生了变化。

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