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Investigations on Microcrystalline Silicon Films for Solar Cell Application

机译:用于太阳能电池的微晶硅薄膜的研究

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摘要

Hydrogenated microcrystalline silicon (μe-Si :H) thin film for solar cells is prepared by plasma-enhanced chemical vapor deposition and physical properties of the μc-Si: H p-layer has been investigated. With respect to stable efficiency, this film is expected to surpass the performance of conventional amorphous silicon based solar cells and very soon be a close competitor to other thin film photovoltaic materials. Silicon in various structural forms has a direct effect on the efficiency of solar cell devices with different electron mobility and photon conversion. A Raman microscope is adopted to study the degree of crystallinity of Si film by analyzing the integrated intensity peaks at 480,510 and 520 cm , which corresponds to the amorphous phase (a-Si:H), microcrystalline (μc-Si:H) and large crystals (c-Si), respectively. The crystal volume fraction is calculated from the ratio of the crystalline and the amorphous phase. The results are compared with high-resolution transmission electron microscopy (HR-TEM) for the determination of crystallinity factor. Optical properties such as refractive index, extinction coefficient, and band gap are studied with reflectance spectra.
机译:通过等离子体增强化学气相沉积法制备了用于太阳能电池的氢化微晶硅(μe-Si:H)薄膜,并研究了μc-Si:H p层的物理性质。关于稳定的效率,该膜有望超越常规的基于非晶硅的太阳能电池的性能,并很快成为其他薄膜光伏材料的有力竞争者。各种结构形式的硅直接影响具有不同电子迁移率和光子转换率的太阳能电池器件的效率。拉曼显微镜通过分析在480,510和520 cm处的积分强度峰来研究Si膜的结晶度,该峰对应于非晶相(a-Si:H),微晶(μc-Si:H)和大相。晶体(c-Si)。晶体体积分数由结晶相和非晶相的比率计算。将结果与高分辨率透射电子显微镜(HR-TEM)进行比较,以确定结晶度。用反射光谱研究诸如折射率,消光系数和带隙的光学性质。

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