Charge Transport in Metal-Molecule-Metal Junctions Probed by Conducting Atomic Force Microscopy

摘要

Charge transport through molecular monolayers has been extensively studied for scientific and technological interest. It is now possible to measure charge transport through single molecules or small molecular groups bridging macroscopic external contacts with the rapid development of various measuring techniques. For example, conducting atomic force microscopy (CAFM) is a widely used technique to achieve reliable electrical contacts to self-assembled monolayers (SAMs). In this study, we report a study of charge transport in alkanedithiol SAMs formed in metal-molecule-metal junctions using CAFM in combination with a variety of molecular transport techniques including temperature-and length-variable transport measurements and transition voltage spectroscopy. The main goal of this study is to probe the intrinsic transport properties of component molecules using CAFM, but not parasitic or defect-related effects.