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首页> 外文期刊>The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical >Conducting Probe Atomic Force Microscopy Investigation of Anisotropic Charge Transport in Solution Cast PBD Single Crystals Induced by an External Field
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Conducting Probe Atomic Force Microscopy Investigation of Anisotropic Charge Transport in Solution Cast PBD Single Crystals Induced by an External Field

机译:导电探针原子力显微镜研究外场诱导的溶液浇铸PBD单晶中各向异性电荷传输

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摘要

2-(4-Biphenylyl)-5-(4-tert-butylphenyl)-l,3,4-oxdiazole (PBD) is a good electron-transporting material and can form single crystals from solution.In this work,solution cast PBD single crystals with different crystallographic axes (b,c) perpendicular to the Au/S substrates in large area are achieved by controlling the rate of solvent evaporation in the presence and absence of external electrostatic field,respectively.The orientation of these single crystals on Au/S substrate was characterized by transmission electron microscopy (TEM) and atomic force microscopy (AFM).Conducting probe atomic force microscopy (CP-AFM) was used to measure the charge transport characteristics of PBD single crystals grown on Au/S substrates.Transport was measured perpendicular to the substrate between the CP-AFM tip and the Au/S substrate.The electron mobility of 3 x 10~3 cm~2/(V s) for PBD single crystal along crystallographic b-axis is determined.And the electron mobility of PBD single crystal along the c-axis is about 2 orders of magnitude higher than that along the b-axis due to the anisotropic charge transport at the low voltage region.We demonstrate that CP-AFM may be applied successfully to measuring the anisotropic charge transport of single crystals over nanoscopic length scales.
机译:2-(4-联苯基)-5-(4-叔丁基苯基)-1,3,4-恶二唑(PBD)是一种良好的电子传输材料,可以从溶液中形成单晶。在存在和不存在外部静电场的情况下,通过分别控制溶剂的蒸发速率,可以实现大面积垂直于Au / S衬底的,具有不同晶轴(b,c)的单晶。这些单晶在Au上的取向用透射电子显微镜(TEM)和原子力显微镜(AFM)对/ S衬底进行了表征,用导电探针原子力显微镜(CP-AFM)测量了在Au / S衬底上生长的PBD单晶的电荷传输特性。垂直于CP-AFM尖端和Au / S衬底之间的衬底进行测量。确定PBD单晶沿结晶b轴的电子迁移率3 x 10〜3 cm〜2 /(V s)。 PBD单晶沿c-的电子迁移率由于低压区域的各向异性电荷传输,轴的轴方向比沿b轴的轴方向高约2个数量级。我们证明CP-AFM可以成功地用于测量单晶的纳米长度尺度上的各向异性电荷传输。

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