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High pressure effect on MoS_2 and MoSe_2 single crystals grown by CVT method

机译:高压对CVT法生长的MoS_2和MoSe_2单晶的影响

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摘要

Single crystals of MoS_2 and MoSe_2 were grown by chemical vapour transport method using iodine as a transporting agent and characterized by optical microscopy, energy dispersive analysis (EDAX), X-ray powder diffraction (XRD) and Hall mobility at room temperature. The variation of electrical resistance under pressure was monitored in a Bridgman anvil set-up up to 6.5 GPa to identify occurrence of any structural transition. MoS_2 and MoSe_2 do not undergo any structural transitions under pressure.
机译:MoS_2和MoSe_2的单晶以碘为传输剂通过化学气相传输法生长,并在室温下通过光学显微镜,能量色散分析(EDAX),X射线粉末衍射(XRD)和霍尔迁移率表征。在Bridgman砧座装置(最高6.5 GPa)中监控压力下的电阻变化,以识别是否发生任何结构转变。 MoS_2和MoSe_2在压力下不会发生任何结构转变。

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