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Adsorption-desorption study of benzotriazole in a phosphate-based electrolyte for Cu electrochemical mechanical planarization

机译:磷酸基电解质中苯并三唑在铜电化学机械平面化中的吸附-解吸研究

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摘要

In this article, the adsorption-desorption behavior of benzotriazole (BTA) in a phosphate-based electrolyte developed for Cu electrochemical mechanical planarization (ECMP) is studied. The formation of a continuous BTA passive film adsorbed on the Cu surface has been characterized by atomic force microscopy (AFM). Additionally, the adsorption behavior of BTA was found to be mass-transfer-controlled at lower operating potentials (<0.7 V vs. Ag/AgCl). Using a microfluidic electrochemical device and electrochemical impedance spectrum (EIS), it was also observed that at low BTA concentrations (<0.002 M), more time was necessary to form an effective passive film on the Cu surface. Furthermore, the desorption time obtained from a potentiometric response to the removal of BTA from the electrolyte increases with increasing BTA concentration or decreasing applied potential. It is critical to expand the operating potential window and to reduce the usage of inhibitors in the proposed ECMP process to enhance the removal rate and the reduction of organic residues, Therefore, the combined microfluidic and electrochemical methodology is proven useful in finding suitable BTA concentrations and a wider potential window.
机译:在本文中,研究了为铜电化学机械平面化(ECMP)开发的磷酸盐基电解质中苯并三唑(BTA)的吸附-解吸行为。吸附在铜表面的连续BTA钝化膜的形成已通过原子力显微镜(AFM)进行了表征。此外,发现BTA的吸附行为在较低的工作电势下(相对于Ag / AgCl,<0.7 V)受传质控制。使用微流体电化学装置和电化学阻抗谱(EIS),还观察到在低BTA浓度(<0.002 M)下,需要更多的时间在Cu表面形成有效的钝化膜。此外,从电位分析到从电解液中去除BTA的电位响应所获得的解吸时间随着BTA浓度的增加或施加电位的降低而增加。在建议的ECMP工艺中扩大操作潜力窗口并减少抑制剂的使用至关重要,以提高去除速率和减少有机残留物,因此,微流体和电化学方法相结合已被证明可用于寻找合适的BTA浓度和更大的潜在窗口。

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