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首页> 外文期刊>Electrochemical and solid-state letters >Formation of low resistance and high reflectivity reflector on p-type GaN using NiAuWAg ohmic contact
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Formation of low resistance and high reflectivity reflector on p-type GaN using NiAuWAg ohmic contact

机译:使用NiAuWAg欧姆接触在p型GaN上形成低电阻和高反射率的反射器

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摘要

We investigate the properties of a NiAuWAg reflector layer deposited on a p-GaN layer for use in high efficiency GaN flip-chip light-emitting diodes (LEDs) or vertical LEDs. The FCLEDs fabricated with NiAuWAg contact showed good current-voltage characteristic and an enhanced the optical output power compared to those fabricated with NiAuAg contact due to the high reflectivity, smooth surface after annealing, and good Ohmic property of NiAuWAg. These results clearly indicate that a NiAuWAg contact on p-GaN constitutes a promising reflector and Ohmic scheme for achieving high-brightness LEDs.
机译:我们研究了沉积在p-GaN层上的NiAuWAg反射层的特性,该层可用于高效GaN倒装芯片发光二极管(LED)或垂直LED。与NiAuAg触点制造的FCLED相比,NiAuWAg触点制造的FCLED具有良好的电流-电压特性,并且由于NiAuWAg的反射率高,退火后的表面光滑以及NiAuWAg的良好欧姆特性,因此具有更高的光输出功率。这些结果清楚地表明,p-GaN上的NiAuWAg接触构成了用于实现高亮度LED的有希望的反射器和欧姆方案。

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