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Carrier-suppressing effect of Mg in solution-processed Zn-Sn-O thin-film transistors

机译:镁对固溶Zn-Sn-O薄膜晶体管的载流子抑制作用

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We investigated the effect of Mg addition on solution-processed Zn-Sn-O (ZTO) thin-film transistors (TFTs). Because Mg affects the optical bandgap and the metal-oxygen bond in ZTO films, the carrier concentration of Mg-Zn-Sn-O (MZTO) films was suppressed by Mg. As the molar ratio of Mg increased in the MZTO TFTs annealed at 500°C, the onoff ratio increased, and the subthreshold gate swing (S.S) decreased considerably. As a result, the MZTO TFT showed a saturation mobility of 1.00 cm ~2V s, an S.S of 0.92 Vdecade, a threshold voltage (V _(th)) of 6.60 V, and an onoff ratio of 3.15 ×10 ~6.
机译:我们研究了添加镁对溶液处理的Zn-Sn-O(ZTO)薄膜晶体管(TFT)的影响。因为Mg影响ZTO薄膜中的光学带隙和金属-氧键,所以Mg-Zn-Sn-O(MZTO)薄膜的载流子浓度受到抑制。随着在500°C退火的MZTO TFT中Mg的摩尔比增加,通断比增加,并且亚阈值栅极摆幅(S.S)大大降低。结果,MZTO TFT显示出1.00cm〜2Vs的饱和迁移率,0.92Vdecade的S.S,6.60V的阈值电压(V_(th)),以及3.15×10〜6的导通比。

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