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Stress-induced transfer of ultrathin silicon layers onto flexible substrates

机译:应力诱导的超薄硅层到柔性基板上的转移

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摘要

Stress-induced cleavage was investigated as a method of transferring sizable areas of thin layers of silicon onto alternative substrates such as sapphire and flexible substrates. By bonding bulk silicon to a sapphire handle wafer using the polymer SU-8, an ultrathin layer of silicon can be transferred from the donor substrate onto the sapphire via mechanical cleavage. The thickness of the transferred silicon is essentially determined by the processing steps and the elastic properties of the composite structure. We further show that a double-flip process enables the complete transfer of ultrathin Si onto flexible substrates.
机译:作为将硅薄层的相当大的区域转移到诸如蓝宝石和柔性衬底之类的可替换衬底上的一种方法,研究了应力诱导的劈裂。通过使用聚合物SU-8将块状硅粘结到蓝宝石处理晶片上,可以通过机械切割将超薄硅层从施主衬底转移到蓝宝石上。转移的硅的厚度基本上由加工步骤和复合结构的弹性性质决定。我们进一步表明,双重翻转工艺可以将超薄硅完全转移到柔性基板上。

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