首页> 外国专利> Method for transfer of silicon layer towards substrate support to form silicon on insulator wafer of backside illumination image forming device, involves making doped layer and layer of p-type silicon substrate to be porous

Method for transfer of silicon layer towards substrate support to form silicon on insulator wafer of backside illumination image forming device, involves making doped layer and layer of p-type silicon substrate to be porous

机译:用于将硅层转移到衬底支撑件上以在背面照明图像形成装置的绝缘体晶片上形成硅的方法,包括使掺杂层和p型硅衬底层多孔化

摘要

The method involves doping a surface region of a P-type silicon substrate (102) to form a doped layer (104). The doped layer and a layer (106) of the p-type silicon substrate underlying the doped layer are made porous. Monocrystalline silicon layer (108) is formed on the porous doped layer by epitaxial growth, and a substrate support (112) is fixed to the monocrystalline silicon layer. The monocrystalline silicon layer is separated from the silicon substrate within the porous layers, where the substrate has a doping level less than specific values. The doped layer and the porous doped layer possess porosities whose difference provides better quality to the monocrystalline silicon layer and separation of the monocrystalline silicon layer from the silicon substrate by thermal treatment without damaging the monocrystalline silicon layer. An independent claim is also included for a silicon structure.
机译:该方法包括掺杂P型硅衬底(102)的表面区域以形成掺杂层(104)。使掺杂层和在掺杂层下面的p型硅衬底的层(106)多孔。通过外延生长在多孔掺杂层上形成单晶硅层(108),并且将基板支撑件(112)固定到单晶硅层上。单晶硅层在多孔层内与硅衬底分开,其中衬底的掺杂水平小于特定值。掺杂层和多孔掺杂层具有孔隙率,所述孔隙率的差异为单晶硅层提供了更好的质量,并且通过热处理将单晶硅层与硅衬底分离,而不会损坏单晶硅层。对于硅结构也包括独立权利要求。

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