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3-D ICs with TSVs: The Hard Work Continues

机译:具有TSV的3D IC:艰苦的工作还在继续

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摘要

Performance remains the main driver in the adoption of 3-D ICs with through-silicon vias (TSVs), but the timeline for its adoption keeps shifting out. The industry has seen great progress in via formation and filling. Metrology tools were helpful in developing the process. These tools were useful in revealing problems such as missing copper in vias and delamination, allowing processes to be modified in order to solve the problems. However, there are still obstacles to high-volume manufacturing of 3-D ICs with TSVs. Much hard work remains before yields improve sufficiently to reduce the cost of the technology to enable it to be used in many applications.
机译:在采用带硅通孔(TSV)的3D IC时,性能仍然是主要驱动力,但采用该技术的时间表一直在变化。该行业在通孔形成和填充方面取得了长足的进步。计量工具有助于开发流程。这些工具对于揭示诸如过孔中的铜遗漏和分层等问题很有用,允许修改工艺以解决问题。但是,采用TSV的3D IC的批量生产仍然存在障碍。在成品率充分提高以降低该技术的成本以使其能够用于许多应用之前,还需要进行大量的工作。

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