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首页> 外文期刊>ECS Journal of Solid State Science and Technology >Performance Optimization of Conventional CNTFETs Based on Asymmetric Lightly Doped Source and Drain Regions
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Performance Optimization of Conventional CNTFETs Based on Asymmetric Lightly Doped Source and Drain Regions

机译:基于不对称轻掺杂源漏区的常规CNTFET性能优化

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摘要

Carbon nanotube (CNT) could be exploited as a channel or source/drain region in field effect transistors (FETs). We theoretically investigate the impact of Source and Drain doping level on a coaxially gated CNTFET's performance in the ballistic regime. The results show that the On/Off Ratio, Subthreshold swing, Cutoff Frequency, transconductance and delay are improved with choosing the source and drain doping structure. It seems that the most important impact of Source and Drain doping level and length is the reason of change and shift in the transfer characteristics of the device simulation results values. However, form this paper it is possible to choose an optimal value of CNTFET Gate voltage and gate length to obtain better performance. (C) 2016 The Electrochemical Society. All rights reserved.
机译:碳纳米管(CNT)可以用作场效应晶体管(FET)中的沟道或源/漏区。我们从理论上研究了源极和漏极掺杂水平对弹道状态下同轴栅极CNTFET性能的影响。结果表明,通过选择源极和漏极掺杂结构,可以改善开/关比,亚阈值摆幅,截止频率,跨导和延迟。看来,源极和漏极掺杂水平和长度的最重要影响是器件仿真结果值的传输特性发生变化和偏移的原因。但是,从本文中可以选择CNTFET栅极电压和栅极长度的最佳值以获得更好的性能。 (C)2016年电化学学会。版权所有。

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